471-TT Version L

One-pass measurement system for DC measurement and avalanche tolerance testing.

By integrating with ACCRETECH’s prober (AP3000), this system enables higher-quality measurements of large-diameter power device wafers. It is a high-efficiency measurement system that also allows simultaneous measurement of multiple chips.

Feature

・Seamless Measurement
Enables continuous and smooth measurement from DC (high current, high voltage) to L-load (avalanche tolerance).
・High-Quality and Optimized Measurement Environment
Provides a high-quality and optimized measurement environment with WTS (Wafer Test System), DARUMA stage, and pressure card functionality.
・Supports Simultaneous Measurement of 4 Chips
Simultaneous measurement of multiple chips significantly improves production efficiency.
・High-Speed Cutoff During L-Load Measurement
In case of device failure, the measurement path is cut off within a short time (500nS or less).