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Test Systems
Handlers
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Discrete Device Test System
471-TT
471-TT is a DC tester with a new concept that realizes the simultaneous measurement of multiple chips in the wafer process. Inheriting TESEC's strength in high-voltage and high-current measurement technology, the tester has significantly increased the productivity compared to the conventional testers by measuring multiple chips simultaneously. One-Pass test of Avalanche measurement*1 is supported to meet the demand of today's market. （*1） Dedicated measurement unit, which is only for 8 parallel model, is required. Also, it may not be applicable depending on the test condition and measurement environment.
431-TT
This test system is designed to measure the static characteristics of discrete semiconductor devices. 1.2 kV / 65 A (130 A for C-E) measurement is available as a standard and that can be expanded to 2.2 kV / 65 A (200 A for C-E). With an optional unit, at a maximum of 5 kV / 2000 A measurement is available. With its high versatility, the tester can be used in various applications such as the wafer test when a prober is connected and the final test when a handler is connected.
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IPD/IPM Test System
530-IT
IPD/IPM Test System 530-IT is designed with a new concept that incorporates the idea of IC tester into the DNA of power devices measurement technology TESEC has accumulated over many years. It provides the optimized testing solutions for IPD/IPM, which is a combination of Logic ICs and Power Devices, and various other devices.
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Thermal Resistance Tester
4408-KT
4408-KT is designed to measure the transient thermal resistance characteristics of GaN HEMT as the VGS's temperature change (ΔVGS). The measured value VGS1 and ΔVGS value are displayed on the front panel display.
4324-KT
The KT series testers are designed to measure the thermal resistance characteristics of transistors, diodes, MOSFETs, and IGBTs. It can also measure the Safe Operating Area (SOA) of the devices. In addition to Contact Check function for more accurate measurement, device protection circuit is also equipped.
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Inductive Load Tester
4602-LV
4602-LV is designed to evaluate the Avalanche resistance based on how the waveform pass the Safe Operating Area (SOA) specified with the V-Gate, IH, and IL by monitoring the turn-off waveform of inductive load. VDS(SUS) at the current value specified by the IH can also be measured. With the conventional measurement method, applied current is limited by applied voltage, moreover, the MOSFET has a characteristic that as the ON Resistance lowers the current required to measure increases; thus, the method became difficult to measure the MOSFET of medium breakdown voltage (several tens of voltage). To accomplish the task, new measurement methods* are added to perform the high current measurement, and the voltage and current this tester can apply are respectively increased to 300 V and 200 A so that it is now capable of measuring wider range of devices. *The VD-OFF mode is added to separate the VD power at Avalanche and the Time-Trip mode is added to turn the devices off after the applying current for specified time.
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Dynamic Test System
3430-SW
3430-SW is designed to measure the dynamic characteristics of IGBT/MOSFET devices at high speed. Parallel measurement is available at up to 4 test stations by connecting the 3430-SW and respective test stations provided for test items. (Standard: 2 test stations) Whole system can be controlled by on computer.
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Film Frame Test Handler
5170-IH
5170-IH is the handler to test the leadless devices such as QFN,BGA and WLCSP diced on the wafer ring. It is capable of hot and cold temperature test. The stable testing and high speed indexing of the devices on the ring are supported by precise device positioning information and optimized probe-pin contact pressure that are ensured by the positioning (x, y, z, θ) compensation before testing with visual inspection system.
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Die Sorter
4605-HTR
4605-HTR is designed to test the leadless devices diced on the UV film of the wafer ring such as QFN, BGA, and WLCSP. This high speed die sorter picks up non-defective devices from the film based on the MAP file measured in the front-end process, performs the 6 dimensional visual inspection, and then store them to embossed carrier tapes. As a high-speed sorting machine compatible with the wafer ring size of up to 12 inches, it helps to achieve a significant improvement in the efficiency of inspection process. Equipped visual inspection and handling systems satisfy the stringent standard of WLCSP and Wettable Flank-plated QFN. Proven track records of this handler include the contributions to the automotive semiconductor and the installation to the class 10000 cleanrooms (ISO 7).
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Gravity Handler
4330-IH
4330-IH is a gravity tri-temp handler having a large capacity chamber to perform the environment measurement of power devices such as TO220, D-PAK, D2-PAK, and DIP. High UPH (14,400 pcs.) is accomplished while keeping 120 seconds of Soak time for TO220 and D2PAK by implementing at a maximum of 8 test sites (when socket contactor is used). Temperature control accuracy of ±2℃ is guaranteed in the range of −60℃ to 0℃ for Cold Temp as well as 50℃ to 175℃ for Hot Temp.
LT4530
LT4530 series are available in two different configurations. T4530-T LT4530T is the latest model which features a high throughput capability, 8 sites , hot and cold temperature testing, and high-frequency contacts. High utilization rate of this handler is achieved by thorough preventions of jams and lead deformations. With the high throughput and the high reliability, LT series is highly evaluated globally. LT4530-D This version features 4 sites and hot temperature testing. High utilization rate of this handler is achieved by thorough preventions of jams inherited from the LT9900.
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MEMS Handler
4664-IH
The ULTRA is a test handler designed for final test of Micro-Electro-Mechanical Systems (MEMS) such as Accelerometers and Gyroscopes. It provides the 6DOF (3-axis acceleration + 3-axis gyroscope) measurement under hot and cold environment at a maximum of 96 multi-site test. The test station unit called ULTRA L is also ready to provide the manual measurement for research and development purpose. For devices requiring longer measurement time, 5164-IH offers superior cost-performance.
5164-IH
The ULTRA is a test handler designed for final test of Micro-Electro-Mechanical Systems (MEMS) such as Accelerometers and Gyroscopes. It provides the 6DOF (3-axis acceleration + 3-axis gyroscope) measurement under hot and cold environment at a maximum of 96 multi-site test. The test station unit called ULTRA L is also ready to provide the manual measurement for research and development purpose. For devices requiring shorter measurement time, 4664-IH offers the best experience with its high throughput.
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TAB Handler
AH9710T
The AH9710 is the auto handler for TCP and COF to test the electrical characteristics of ICs which are inner-bonded to the 35 mm, 48 mm, or 70 mm width tape carrier. The TAB tape is sent from the supply reel (upper) to the test site at any set pitch and positioned very accurately with respect to X and Y directions. Then the electrical characteristics are tested by the contactor which is connected to the tester. Based on the test results, the tested IC is sorted, and the TAB is wound up on the receive reel (lower). All the processes are automatically performed.
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