471-TT

471-TT is a DC tester with a new concept that realizes the simultaneous measurement of multiple chips in the wafer process.
Inheriting TESEC's strength in high-voltage and high-current measurement technology, the tester has significantly increased the productivity compared to the conventional testers by measuring multiple chips simultaneously.
One-Pass test of Avalanche measurement*1 is supported to meet the demand of today's market.
（*1） Dedicated measurement unit, which is only for 8 parallel model, is required. Also, it may not be applicable depending on the test condition and measurement environment.

Feature

・Improved cost performance through simultaneous measurement of multiple chips (8 / 16 parallel)
・DC measurement and Avalanche measurement in 1 test system
・Significantly shortened the data transmission time by LAN connection
・Faster relay switching shortened the measurement time
・Parallel measurement is stabilized by our accumulated measurement technology (Max 2 kV / 20 A)
・Voltage and Current Limitation settings reduce the load on the probe pin
・Automatically calculate the number of chips to be measured simultaneously so that total required current of the chips to be lower than the predetermined maximum applicable current value (current capacity of the prober chuck)